Alm, Rebekka and Kiehl, Sven and Lantow, Birger and Sandkuhl, Kurt (2013) Applicability of Quality Metrics for Ontologies on Ontology Design Patterns. In: KEOD 2013 - Proceedings of the International Conference on Knowledge Engineering and Ontology Development, Vilamoura, Algarve, Portugal, 19-22 September, 2013.
Full text not available from this repository.| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Subjects: | A General Works |
| Depositing User: | Users 0 not found. |
| Date Deposited: | 26 Sep 2017 08:45 |
| Last Modified: | 16 Nov 2017 09:19 |
| URI: | http://eprints.win.informatik.uni-rostock.de/id/eprint/169 |
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